Read Essentials of Electronic Testing for Digital, Memory, and Mixed-Signal VLSI Circuits

Essentials of Electronic Testing for Digital, Memory, and Mixed-Signal VLSI Circuits

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Description:Today's electronic design and test engineers deal with several types of subsystems, namely, digital, memory, and mixed-signal, each requiring different test and design for testability methods. This book provides a careful selection of essential topics on all three types of circuits. The outcome of testing is product quality, which means meeting the user's needs at a minimum cost.' The book includes test economics and techniques for determining the defect level of VLSI chips. Besides being a textbook for a course on testing, it is a complete testability guide for an engineer working on any kind of electronic device or system or a system-on-a-chip. The book consists of: Part I: Introduction, Test Process and ATE, Test Economics and Product Quality, Fault Modeling; Part II: Logic and Fault Simulation, Testability Measures, Combinatorial ATPG, Sequential ATPG, Memory Test, DSP-Based Analog Test, Model-Based Analog Test, Delay Test, IDDQ Test; Part III: DFT and Scan Design, BIST, Boundary Scan, Analog Test Bus, System Test and Core-Based Design, Future Testing; Appendices: Cyclic Redundancy Code Theory, Primitive Polynomials, Books on Testing; Bibliography: over 700 entries.We have made it easy for you to find a PDF Ebooks without any digging. And by having access to our ebooks online or by storing it on your computer, you have convenient answers with Essentials of Electronic Testing for Digital, Memory, and Mixed-Signal VLSI Circuits. To get started finding Essentials of Electronic Testing for Digital, Memory, and Mixed-Signal VLSI Circuits, you are right to find our website which has a comprehensive collection of manuals listed.
Our library is the biggest of these that have literally hundreds of thousands of different products represented.

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ISBN: 0792379918

Description: Today's electronic design and test engineers deal with several types of subsystems, namely, digital, memory, and mixed-signal, each requiring different test and design for testability methods. This book provides a careful selection of essential topics on all three types of circuits. The outcome of testing is product quality, which means meeting the user's needs at a minimum cost.' The book includes test economics and techniques for determining the defect level of VLSI chips. Besides being a textbook for a course on testing, it is a complete testability guide for an engineer working on any kind of electronic device or system or a system-on-a-chip. The book consists of: Part I: Introduction, Test Process and ATE, Test Economics and Product Quality, Fault Modeling; Part II: Logic and Fault Simulation, Testability Measures, Combinatorial ATPG, Sequential ATPG, Memory Test, DSP-Based Analog Test, Model-Based Analog Test, Delay Test, IDDQ Test; Part III: DFT and Scan Design, BIST, Boundary Scan, Analog Test Bus, System Test and Core-Based Design, Future Testing; Appendices: Cyclic Redundancy Code Theory, Primitive Polynomials, Books on Testing; Bibliography: over 700 entries.We have made it easy for you to find a PDF Ebooks without any digging. And by having access to our ebooks online or by storing it on your computer, you have convenient answers with Essentials of Electronic Testing for Digital, Memory, and Mixed-Signal VLSI Circuits. To get started finding Essentials of Electronic Testing for Digital, Memory, and Mixed-Signal VLSI Circuits, you are right to find our website which has a comprehensive collection of manuals listed.
Our library is the biggest of these that have literally hundreds of thousands of different products represented.

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Essentials of Electronic Testing for Digital, Memory, and Mixed-Signal VLSI Circuits

Essentials of Electronic Testing for Digital, Memory, and Mixed-Signal VLSI Circuits

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